Product Description
Cost-effective and compact entry-level X-Ray Fluorescence (XRF) Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys.
Features
- Lightweight instrument, compact design, low mass (appr. 25 kg, 55 lb) and small footprint
- Specialised for the cost-effective XRF analysis of gold alloys
- Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
- With semiconductor detector also applicable for more complex analyses with many elements
- Measuring direction from bottom to top, this allows for quick and easy sample positioning
Typical fields of application are the analysis of
- Gold and precious metal analysis in the jewellery and watch industries
- Analysis of dental alloys
- Yellow and white gold
- Platinum and silver
- Rhodium
- Alloys and coatings
- Multi layer coatings
For more information visit Helmut Fischer
